It should also allow you run production test phases and optimise the functionality for low power, all on a per die basis.

Critical Voltage & Timing AnalysisĪ process detector should allow you to not only analyse critical voltage but also enable supply/logic experimentation. Therefore a better measurement and representation of the process brings with it a greater opportunity to optimise.

Process Monitors can also be used to enable continuous Dynamic Voltage & Frequency Scaling (DVFS) optimisation systems to be utilised within the SoC design. If an IC can self-determine its own manufactured process characteristics it can provide critical information regarding system optimisation on a per die basis. “When things are measured, they can be optimised” this couldn’t be more true in the case of Process Monitors. Listed below are the 5 things to consider: 1. On a per die basis you need to carefully consider the following questions: What is your process type? What is the process variability likely to be and how will this impact your design? How is your silicon ageing? How can you dynamically optimise performance? Customer products are becoming ever more compelling and there is a greater need to overcome the physical challenges of advanced nodes. Understanding how the chip has been made (process) has become a critical requirement for advanced node semiconductor design. When selecting an embedded Process Monitor for use within your digital SoC it is important to make sure it ticks certain boxes.

What to look out for when selecting an Embedded Process Monitor.

Application process monitoring